Microscopy (SPM, SEM)
Our laboratories are equipped with:
- Two commercial scanning probe microscopes (AutoProbe Veeco, NT-MDT Ntegra) providing various modes such as AFM, LFM, conductive AFM, EFM, Kelvin probe, nanolithography mode and in case of NT-MDT microscope also a near field mode (SNOM) providing illumination and collection operational regimes both in reflection or transmission (inverted microscope) measuring schemes.
- Scanning electron microscope with a lithographic option (Tescan – Vega)
- Optical microscopy (Nicon Elipse) and setup for oprical properties measurement.