2015-05
Educational Model of Scanning Probe Microscope
The model of a scanning probe microscope is developed for educational purposes and for presentation of SPM techniques. The developement of the hardware, electronics and software of the model was conducted at Institute of Physical Enginering, FME, BUT. The model is capable of demostrating AFM technique, but it is open and can be easily supplemented with other techniques. The impemented measurement modes are contact and tapping mode AFM, both in constant hight and constant tip-sample interaction regime. The model is fitted into a carrying case for easy transportation. The single-board computer is implemented into the microscope model for the measurement setup and data acquisiton. Only additional display is needed for the measurement.
