1996 - 2007

J. Čechal, M. Kolíbal, P. Kostelník, T. Šikola: Gallium structure on the Si(111)–(7×7) surface: influence of Ga coverage and  temperature. J. Phys.: Condens. Matter 19 (2007), 016011.

P. Kostelník, N. Seriani, G. Kresse, A. Mikkelsen, E. Lundgren, V. Blum, T. Šikola, P. Varga, M. Schmid: The Pd(100)-(√5×√5)R27°-O surface oxide: a LEED, DFT and STM study. Surf. Sci. 601 (2007), 1574.

J. Čechal, J. Mach, S. Voborný, P. Kostelník, P. Bábor, J. Spousta, T. Šikola: A study of Ga layers on Si(100)-(2×1) by SR–PES: influence of adsorbed water. Surf. Sci. 601 (2007), 2047.

S. Průša, M. Kolíbal, P. Bábor, J. Mach, T. Šikola: Analysis of thin films by TOF-LEIS. Acta Phys. Pol. A 111 (2007), 335.

M. Bartošík, D. Škoda, O. Tomanec, R. Kalousek, P. Jánský, J. Zlámal, J. Spousta, T. Šikola: The influence of humidity on the kinetics of local anodic oxidation. J. Phys.: Conference Series 61 (2007), 75.

M. Urbánek, J. Spousta, T. Běhounek, T. Šikola: Imaging reflectometery in situ. Appl. Optics 46 (2007), 6309.

B. Lencová, J. Zlámal: The development of EOD program for the design of electron optical devices (extended abstract). Microsc. Microanal. 13 (2007), 2.

M. Kolíbal, O. Tomanec, S. Průša, M. Plojhar, S. N. Markin,  L. Dittrichová, J. Spousta,  P. Bauer, T. Šikola: TOF-LEIS spectra of Ga/Si: peak shape analysis. Nucl. Instrum. Methods Phys. Res., Sect. B 265 (2007), 569.

M. Schmid, A. Reicho, A. Stierle, I. Costina, J. Klikovits, P. Kostelník, O. Dubay, G. Kresse, J. Gustafson, E. Lundgren, J. N. Andersen, H. Dosch, P. Varga: Structure of Ag(111)–p(4×4)–O: No Silver Oxide. Phys. Rev. Lett. 96 (2006), 146102.

M. Kolíbal, S. Průša, M. Plojhar, P. Bábor, M. Potoček, O. Tomanec,  P. Kostelník,  S. N. Markin, P. Bauer, T. Šikola: In situ Analysis of Ga–ultra Thin Films  by ToF–LEIS. Nucl. Instrum. Methods Phys. Res., Sect. B 249 (2006), 318.

J. Čechal, T. Šikola: A study of the formation and oxidation of PtSi by SR–PES. Surf. Sci. 600 (2006), 4717.

J. Červenka, R. Kalousek, M. Bartošík, D. Škoda, O. Tomanec, T. Šikola: Fabrication of nanostructures on Si(100) and GaAs(100) by local anodic oxidation. Appl. Surf. Sci. 253 (2006), 2373.

M. Draxler, S. N. Markin, M. Kolíbal, S. Průša, T. Šikola, P. Bauer: High resolution time-of-flight low energy ion scattering, Nucl. Instrum. Methods Phys. Res., Sect. B 230 (2005), 398.

P. Dub and O. Litzman: The Ewald dynamical diffraction theory – ninety years later, Acta Crystallogr., Sect. A: Found. Crystallogr. 61 (2005), 209.

S. Voborný, M. Kolíbal, J. Mach, J. Čechal, P. Bábor, S. Průša, J. Spousta, T. Šikola: Deposition and in-situ characterization of ultra-thin films, Thin Solid Films 459 (2004), 17.

J. Čechal, P. Tichopádek, A. Nebojsa, O. Bonaventurová – Zrzavecká, M. Urbánek, J. Spousta, K. Navrátil, T. Šikola: In situ analysis of PMPSi by spectroscopic ellipsometry and XPS, Surf. Interface Anal. 36 (2004), 1218.

M. Urbánek, J. Spousta, K. Navrátil, R. Szotkowski, R. Chmelík, M. Buček, T. Šikola: Instrument for thin film diagnostics by UV spectroscopic reflectometry, Surf. Interface Anal. 36 (2004), 1102.

M. Kolíbal, S. Průša, P. Bábor, T. Šikola: TOF-LEIS Analysis of Ultra Thin Films: Ga- and Ga-N Layer Growth on Si (111), Surf. Sci. 566–568 (2004), 885.

R. Kalousek, M. Schmid, A. Hammerschmid, E. Lundgren, P. Varga: Slowing down adatom diffusion by an adsorbate: Co on Pt(111) with and without preadsorbed CO, Phys. Rev. B, 68 (2003), 233401.

R. Roučka, J. Jiruše, T. Šikola: Spot intensity processing in LEED images, Vacuum65 (2002), 121.

F. Lopour, R. Kalousek, D. Škoda, J. Spousta, F. Matějka, T. Šikola: Application of AFM in Microscopy and in Fabrication of Micro/Nanostructures, Surf. Interface Anal. 34 (2002), 352.

P. Tichopádek, A. Nebojsa, J. Čechal, P. Bábor, P. Jurkovič, K. Navrátil, T. Šikola: A Study of Thin Oxide Films by Ellipsometry and AR XPS, Surf. Interface Anal. 34 (2002), 531.

J. Spousta, M. Urbánek, R. Chmelík, J. Jiruše, J. Zlámal, K. Navrátil, A. Nebojsa, T. Šikola: In Situ Measurements of Surface Homogenity of Optical Parameters of Weakly Absorbing Thin Films, Surf. Interface Anal. 34 (2002), 664.

J. Tolle, R. Roučka, P. A. Crozier, A. V. G. Chizmeshya, I. S. T. Tsong, J. Kouvetakis: Growth of SiCAlN on Si(111) via a crystalline oxide interface, Appl. Phys. Lett. 81 (2002), 2181.

R. Roučka, J. Tolle, A. V. G. Chizmeshya, P. A. Crozier, C. D. Poweleit, D. J. Smith, I. S. T. Tsong, J. Kouvetakis: Low-temperature epitaxial growth of the quaternary wide band gap semiconductor SiCAlN, Phys. Rev. Lett. 88 (2002), 206102.

A. Mikkelsen, J. H. Petersen, J. Jiruše, S. V. Hoffman, D. L. Adams: The surface structures formed by Na adsorption on Al(110), Surf. Sci. 497 (2002), 214.

Y. Gauthier, M. Schmid, S. Padovani, E. Lundgren, V. Buš, G. Kresse, J. Redinger, P. Varga: Adsorption Sites and Ligand Effect for CO on an Alloy Surace: A Direct View, Phys. Rev. Lett. 87 (2001), 036103.

P. Dub and O. Litzman: A note on the problem of scattering from a single atomic plane and a stack of planes. Differences between the Ewald and other diffraction theories, Acta Crystallogr., Sect. A: Found. Crystallogr. 57 (2001), 212.

P. Dub, O. Litzman: Is the border surface of a crystal indeed the weakest point of the dynamical theory of diffraction?, Acta Crystallogr., Sect. A: Found. Crystallogr. 57 (2001), 686.

A. Mikkelsen, J. H. Petersen, S. V. Hoffmann, J. Jiruše, D. L. Adams: Structure and formation of surface alloys by adsorption of Li on Al(110), Surf. Sci. 487 (2001), 28.

R. Kalousek, F. Lopour, P. Dub, T. Šikola: Vibrational Analysis of the Cantilever in noncontact Scanning Force Microscopy, Surf. Interface Anal. 30 (2000), 292.

A. Mikkelsen, S. V. Hoffmann, J. Jiruše, D. L. Adams: Surface reconstruction and relaxation of Al(110)-c(2×2)-Na, Phys. Rev. B  61 (2000), 13988.

T. Šikola, J. Spousta, L. Dittrichová, M. Stránský, J. Zlámal, F. Matějka, A. Nebojsa, J. Zemek, V. Peřina, D. Rafaja, L. Ranno: Deposition of Magnetic Thin Films by IBAD, Nucl. Instrum. Methods Phys. Res., Sect. B 148 (1999), 907.

J. Jiruše, T. Šikola: Application of simple kinematic predictions for the structural search in LEED, Vacuum 55 (1999), 141.

P. Dub and O. Litzman: The Darwin procedure in optics of layered media and the matrix theory, Acta Crystallogr., Sect. A: Found. Crystallogr. 55 (1999), 613.

A. Mikkelsen, J. Jiruše, D. L. Adams: Structure and dynamics of the Al(110) surface, Phys. Rev. B 60 (1999), 7796.

S. Průša, T. Šikola, J. Zlámal: Design of the entrance ion optics for SIMS and LEIS in-situ monitoring of deposition processes, Nucl. Instrum. Methods Phys. Res., Sect. B 136–138 (1998), 822.

D. Rafaja, V. Valvoda, T. Šikola, J. Spousta: Ab initio study of thin metallic and ceramic films, Thin Solid Films 324 (1998), 198.

T. Šikola, J. Spousta, R. Češka, J. Zlámal, L. Dittrichová, A. Nebojsa, K. Navrátil, D. Rafaja, J. Zemek, V. Peřina: Deposition of Metal Nitrides by IBAD, Surf. Coat. Technol. 108–109 (1998), 284.

J. Humlíček, A. Nebojsa, J. Hora, M. Stránský, J. Spousta, T. Šikola, Ellipsometry and transport studies of thin-film metal nitrides, Thin Solid Films 332 (1998), 25.

T. Šikola, J. Spousta, L. Dittrichová, L. Beneš, V. Peřina, V. Valvoda: Ion beam assisted deposition of metallic and ceramic thin films, Nucl. Instrum. Methods Phys. Res., Sect. B 127–128 (1997), 673.

T. Šikola, L. Dittrichová, J. Spousta, D. Janová, A. Nebojsa, R. Češka: Cleaning of metal surfaces by broad beam ion source, Nucl. Instrum. Methods Phys. Res., Sect. B 127–128 (1997), 865 – 868.

K. Navrátil, T. Šikola: Microhardness of thin molybdenum films, Mater. Sci. Eng. A 234–236 (1997), 390.  

T. Šikola, J. Spousta, L. Dittrichová, A. Nebojsa, V. Peřina, R. Češka, P. Dub: Dual ion beam deposition of metallic thin films, Surf. Coat. Technol. 84 (1996), 485 – 490.

O. Litzman, P. Mikulík, P. Dub: Multiple diffraction of particles on a system of point scatteres as an exactly soluble problem using the Ewald concept, J. Phys.: Condens. Matter 8 (1996), p. 4709.

T. Šikola, D. G. Armour, J. A. van den Berg: An in situ study of processes taking place on a silicon surface during its bombardment by CFx/Ar ions – etching vs. polymerization, J. Vac. Sci. Technol., A 14 (1996), 3156.

E. Pawelec, M.Šimek, H. Nassar, A. Czernichowski, K. Musiol, L. Dittrichová: Temperature Measurements in Non-equilibrium “Ferroelectric” Plasma, Acta Phys. Pol. A 89 (1996), 503.

A. Czernichowski, H. Nassar, A. Ranaivosoloarimanana, A. A. Fridman, M. Šimek, K. Musiol, E. Pawelec, L. Dittrichová: Spectral and Electrical Diagnostics of Gliding Arc, Acta Phys. Pol. A 89 (1996), 595.