Scanning Kerr microscope

The microscope measures magnetooptical Kerr effect in magnetic nanostructures by scanning a focused laser beam over the sample surface. By selecting the position of the laser beam in the entrance aperture of the microscope objective it is possible to select a required experiment geometry – to measure either longitudinal, transversal or polar Kerr effect. By using 3D scanning piezostage it is possible to precisely focus on the sample surface (z-axis of the piezostage) and to acquire 2D maps of reflectivities and Kerr rotations (x-y axes of the piezostage). The microscope also allows for precise measurement in each pixel of the sample. The achived resolution is 560 nm.