Near-field interference patterns
26/07/2017, Filip Ligmajer
Imaging of near-field interference patterns by aperture-type SNOM
We have performed a study of main principles behind image formation in aperture-type scanning near-field optical microscopy (a-SNOM). In particular, we have investigated the role of illumination wavelength and polarization state. A series of measurements of plasmonic interference patterns together with numerical simulations allowed us to identify the role of individual near-field components in formation of a-SNOM images.