Near-field interference patterns


26/07/2017, Filip Ligmajer

Imaging of near-field interference patterns by aperture-type SNOM


We have performed a study of main principles behind image formation in aperture-type scanning near-field optical microscopy (a-SNOM). In particular, we have investigated the role of illumination wavelength and polarization state. A series of measurements of plasmonic interference patterns together with numerical simulations allowed us to identify the role of individual near-field components in formation of a-SNOM images.

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